Only available in German
Kolloquium | Testing IoT‐Designs: How to make the impossible possible?
The Internet‐of‐Things (IoT) era has started. Billions of sensors and actuator devices will connect the world. It
creates a new market for very small and cost‐sensitive chips. Such designs must fulfill requirements as for
example low power consumption and small form factor. Furthermore, design costs must be as low as possible
in order to be competitive. At the same time, each device must be tested in order to check for its correct
functionality. Unfortunately, the IoT requirements contradict a good testability.
This presentation shows the general problems of poor testability of IoT designs from an industrial point of view
and motivates why effective Design‐for‐Test (DFT) methods are required. It will present new approaches of
how to improve testability of IoT designs while keeping the designs costs low.
Daniel Tille has been with Infineon Technologies AG since 2012. He is responsible for the DFT Concept in the
development of Automotive‐ and Chip Card microcontrollers. Before, he worked at Verified Systems and
Daimler AG on new methods for Automatic Test Generation in the Automotive Domain. He received his
Diploma in Computer Science from Martin‐Luther‐University Halle‐Wittenberg in 2006 and his PhD from
University of Bremen in 2011.
Kontakt: Rolf Drechsler