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Arbeitsgruppe Rechnerarchitektur / AGRA | Informatik | FB03 | Universität Bremen

Dr. Jan Malburg


Bisher habe ich mich mit dem automatischen Testen von Programmen und der automatischen Testfallerzeugung beschäftigt. Mein Schwerpunkt in der Arbeitsgruppe liegt im Bereich des automatischen Debuggings Eingebetteter Systeme. Die Analyse des Datenflusses steht hierbei im Vordergrund.

WiMi

Debugging hardware designs using dynamic dependency graphs
Autor: Jan Malburg, Alexander Finder, Görschwin Fey
Zeitschrift: Microprocessors and Microsystems (MICPRO)
Details: DOI: 10.1016/j.micpro.2016.10.004 (2016)

A Simulation Based Approach for Automated Feature Localization
Autor: Jan Malburg, Alexander Finder, Görschwin Fey
Zeitschrift: IEEE Trans. on CAD of Integrated Circuits and Systems
Details: DOI: 10.1109/TCAD.2014.2360462, Volume:33, Issue: 12, pp. 1886-1899 (2014)

Search-based testing using constraint-based mutation
Autor: Jan Malburg, Gordon Fraser
Zeitschrift: Software Testing, Verification and Reliability
Details: DOI 10.1002/stvr.1508, Volume 24, Issue 6, pp. 472–495 (2013)

Towards Making Fault Injection on Abstract Models a More Accurate Tool for Predicting RT-Level Effects
Autor: Tino Flenker, Jan Malburg, Goerschwin Fey, Serhiy Avramenko, Massimo Violante and Matteo Sonza Reorda
Konferenz: IEEE Computer Society Annual Symposium on VLSI (ISVLSI)
Pdf | Referenz: Bochum, Germany, 2017

Property mining using dynamic dependency graphs
Autor: Jan Malburg, Tino Flenker, Goerschwin Fey
Konferenz: 22nd Asia and South Pacific Design Automation Conference (ASP-DAC)
Pdf | Referenz: Chiba/Tokyo, Japan, 2017

Designing Reliable Cyber-Physical Systems
Autor: Gadi Aleksandrowicz, Eli Arbel, Roderick Bloem, Timon Ter Braak, Sergei Devadze, Görschwin Fey, Maksim Jenihhin, Artur Jutman, Hans G. Kerkhoff, Robert Könighofer, Jan Malburg, Shiri Moran, Jaan Raik, Gerard Rauwerda, Heinz Riener, Franz Röck, Konstantin Shibin, Kim Sunesen, Jinbo Wan, Yong Zhao
Konferenz: Forum on specification & Design Languages (FDL)
Pdf | Referenz: Bremen, Germany, 2016

Automatically Connecting Hardware Blocks via Light-Weight Matching Techniques
Autor: Jan Malburg Niklas Krafczyk Görschwin Fey
Konferenz: IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Pdf | Referenz: pp. 21-26, Warschau, Polen, 2014

Analyse dynamischer Abhängigkeitsgraphen zum Debugging von Hardwaredesigns
Autor: Jan Malburg Alexander Finder Görschwin Fey
Konferenz: 7. ITG/GMM/GI-Fachtagung Zuverlässigkeit und Entwurf (ZuE2013)
Pdf | Referenz: pp. 59-66, Dresden, Germany, 2013

Tuning Dynamic Data Flow Analysis to Support Design Understanding
Autor: Jan Malburg, Alexander Finder, Görschwin Fey
Konferenz: Design, Automation and Test in Europe (DATE'13)
Pdf | Referenz: pp. 1179-1184, Grenoble, France, 2013

Automated Feature Localization for Hardware Designs using Coverage Metrics
Autor: Jan Malburg, Alexander Finder, Görschwin Fey
Konferenz: Design Automation Conference (DAC)
Pdf | Referenz: pp. 941-946, San Francisco, 2012

Mining Latency Guarantees for RT-level Designs
Autor: Jan Malburg, Heinz Riener, Görschwin Fey
Workshop: 4th Workshop on Design Automation for Understanding Hardware Designs (DUHDe)
Referenz: Lausanne, Switzerland, 2017

Generating good properties from a small number of use cases
Autor: Jan Malburg, Tino Flenker, Görschwin Fey
Workshop: International Verification and Security Workshop (IVSW'16)
Referenz: Sant Feliu de Guixols, Catalunya, Spain, 2016

Towards analysing feature locations through testing traces with BUT4Reuse
Autor: Jabier Martinez, Jan Malburg, Tewfik Ziadi, Görschwin Fey
Workshop: DATE Friday Workshop: Design Automation for Understanding Hardware Designs (DUHDe)
Referenz: Grenoble, France, 2015

Mutation based Feature Localization
Autor: Jan Malburg, Emmanuelle Encrenaz-Tiphene, Görschwin Fey
Workshop: 15th International Workshop on Microprocessor Test and Verification
Pdf | Referenz: Austin, USA, 2014

Automatically Connecting Hardware Blocks via Light-Weight Matching Techniques (Extended Abstract)
Autor: Jan Malburg, Niklas Krafczyk, Görschwin Fey
Workshop: DATE Friday Workshop: Design Automation for Understanding Hardware Designs
Pdf | Referenz: page 30, Dresden, Germany, 2014

Mutation based Feature Localization
Autor: Jan Malburg, Emmanuelle Encrenaz-Tiphene, Görschwin Fey
Workshop: DATE Friday Workshop: Design Automation for Understanding Hardware Designs
Referenz: pp. 55-60, Dresden, Germany, 2014

Automated Feature Localization for Hardware Designs using Coverage Metrics
Autor: Jan Malburg, Alexander Finder, Görschwin Fey
Workshop: 15. Workshop Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen (MBMV)
Pdf | Referenz: pp. 85-96, Kaiserslautern, Germany, 2012

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