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Arbeitsgruppe Rechnerarchitektur / AGRA | Informatik | FB03 | Universität Bremen

Dr. Mehdi Dehbashi


Meine Forschung liegt im Bereich des automatischen Debuggings für Eingebettete System. Die Entwicklung von formalen und semi-formalen Methoden steht dabei im Fokus.

WiMi

Debug Automation from Pre-Silicon to Post-Silicon
Autor: Mehdi Dehbashi, Görschwin Fey
Verlag: Springer
Format: eBook, Hardcover (2015)

Transaction-based online debug for NoC-based multiprocessor SoCs
Autor: Mehdi Dehbashi, Görschwin Fey
Zeitschrift: Microprocessors and Microsystems (MICPRO)
Details: DOI: 10.1016/j.micpro.2015.03.003, 39(3): 157-166 (2015)

Debug Automation for Logic Circuits Under Timing Variations
Autor: Mehdi Dehbashi, Görschwin Fey
Zeitschrift: IEEE Design & Test of Computers
Details: DOI 10.1109/MDAT.2013.2266393, Volume 30, Issue 6, pp. 60-69 (2013)

Automated Design Debugging in a Testbench-Based Verification Environment
Autor: Mehdi Dehbashi, André Sülflow, Görschwin Fey
Zeitschrift: Embedded Hardware Design - Microprocessors and Microsystems (MICPRO)
Details: DOI 10.1109/DSD.2011.67, Volume 37, Issue 2, pp. 206-217 (2013)

Constraint-based Pattern Retargeting for Reducing Localized Power Activity during Testing
Autor: Harshad Dhotre, Stephan Eggersglüß, Rolf Drechsler, Mehdi Dehbashi, Ulrike Pfannkuchen
Konferenz: 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Pdf | Referenz: Budapest, Hungary, 2018

Machine Learning Based Test Pattern Analysis for Localizing Critical Power Activity Areas
Autor: Harshad Dhotre, Stephan Eggersglüß, Mehdi Dehbashi, Ulrike Pfannkuchen, Rolf Drechsler
Konferenz: 30th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Pdf | Referenz: Cambridge, UK, 2017

Automated Optimization of Scan Chain Structure for Test Compression-Based Designs
Autor: Harshad Dhotre, Mehdi Dehbashi, Ulrike Pfannkuchen, Klaus Hofmann
Konferenz: IEEE Asian Test Symposium (ATS)
Referenz: Hiroshima, Japan, 2016

Automated Formal Verification of X Propagation with Respect to Testability Issues
Autor: Mehdi Dehbashi, Daniel Tille, Ulrike Pfannkuchen, Stephan Eggersglüß
Konferenz: IEEE International Design and Test Symposium 2014 (IDT)
Pdf | Referenz: pp. 106-111, Algiers, Algerien, 2014

SAT-Based Speedpath Debugging Using Waveforms
Autor: Mehdi Dehbashi, Görschwin Fey
Konferenz: 19th IEEE European Test Symposium (ETS)
Referenz: Paderborn, Germany, 2014

Transaction-Based Online Debug for NoC-Based Multiprocessor SoCs
Autor: Mehdi Dehbashi, Görschwin Fey
Konferenz: 22nd Euromicro Conference on Parallel, Distributed and Network-Based Processing (PDP)
Pdf | Referenz: Turin, Italy, 2014

Debug Automation for Synchronization Bugs at RTL
Autor: Mehdi Dehbashi, Görschwin Fey
Konferenz: 27th International Conference on VLSI Design
Pdf | Referenz: pp. 44-49, Mumbai, India, 2014

Efficient Automated Speedpath Debugging
Autor: Mehdi Dehbashi, Görschwin Fey
Konferenz: 16th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Pdf | Referenz: pp. 48-53, Karlovy Vary, Czech Republic, 2013

Automated Post-Silicon Debugging of Failing Speedpaths
Autor: Mehdi Dehbashi, Görschwin Fey
Konferenz: 21st IEEE Asian Test Symposium (ATS)
Pdf | Referenz: pp. 13-18, Niigata, Japan, 2012

Application of Timing Variation Modeling to Speedpath Diagnosis
Autor: Mehdi Dehbashi, Görschwin Fey
Konferenz: 4th International Conference on System, Software, SoC and Silicon Debug (S4D)
Pdf | Referenz: pp. 34-37, Vienna, Austria, 2012

On Modeling and Evaluation of Logic Circuits Under Timing Variations
Autor: Mehdi Dehbashi, Görschwin Fey, Kaushik Roy, Anand Raghunathan
Konferenz: 15th Euromicro Conference on Digital System Design (DSD)
Pdf | Referenz: pp. 431-436, Izmir, Turkey, 2012

Automated Debugging from Pre-Silicon to Post-Silicon
Autor: Mehdi Dehbashi, Görschwin Fey
Konferenz: 15th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
Pdf | Referenz: pp. 324-329, Tallinn, Estonia, 2012

Functional Analysis of Circuits Under Timing Variations
Autor: Mehdi Dehbashi, Görschwin Fey, Kaushik Roy, Anand Raghunathan
Konferenz: 17th IEEE European Test Symposium (ETS)
Pdf | Referenz: pp. 177, Annecy, France, 2012

Automated Post-Silicon Debugging of Design Bugs
Autor: Mehdi Dehbashi, Görschwin Fey
Konferenz: 3rd International Conference on System, Software, SoC and Silicon Debug (S4D)
Pdf | Referenz: pp. 67-71, Munich, Germany, 2011

Automated Design Debugging in a Testbench-Based Verification Environment
Autor: Mehdi Dehbashi, André Sülflow, Görschwin Fey
Konferenz: 14th Euromicro Conference on Digital System Design (DSD)
Pdf | Referenz: pp. 479-486, Oulu, Finland, 2011
Best Paper Candidate

Fault Effects in FlexRay-Based Networks with Hybrid Topology
Autor: Mehdi Dehbashi, Vahid Lari, Seyed Ghassem Miremadi, Mohammad Shokrollah-Shirazi
Konferenz: 3rd IEEE International Conference on Availability, Reliability and Security (ARES)
Pdf | Referenz: pp. 491-496, Barcelona, Spain, 2008

Evaluation of Babbling Idiot Failures in FlexRay-Based Networks
Autor: Vahid Lari, Mehdi Dehbashi, Seyed Ghassem Miremadi, Mojtaba Amiri
Konferenz: 7th IFAC International Conference on Fieldbuses and Networks in Industrial and Embedded Systems (FET)
Pdf | Referenz: pp. 399-406, Toulouse, France, 2007

Assessment of Message Missing Failures in FlexRay-Based Networks
Autor: Vahid Lari, Mehdi Dehbashi, Seyed Ghassem Miremadi, Navid Farazmand
Konferenz: 13th IEEE/IFIP Pacific Rim International Symposium on Dependable Computing (PRDC)
Pdf | Referenz: pp. 191-194, Melbourne, Australia, 2007

ATPG Constraint Analysis for Reducing Regional Power Activity
Autor: Harshad Dhotre, Stephan Eggersglüß, Rolf Drechsler, Mehdi Dehbashi, Ulrike Pfannkuchen
Workshop: 30. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2018)
Referenz: Freiburg (Breisgau), Germany, 2018

Debug Automatisierung für logische Schaltungen unter Zeitvariation mittels Waveforms
Autor: Mehdi Dehbashi, Görschwin Fey
Workshop: 26. GI/GMM/ITG Workshop für Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ)
Referenz: Bad Staffelstein, Germany, 2014

Towards Debug Automation for Timing Bugs at RTL
Autor: Mehdi Dehbashi, Görschwin Fey
Workshop: 25. GI/GMM/ITG Workshop für Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ)
Pdf | Referenz: Dresden, Germany, 2013

Functional Analysis of Circuits Under Timing Variations
Autor: Mehdi Dehbashi, Görschwin Fey, Kaushik Roy, Anand Raghunathan
Workshop: edaWorkshop
Pdf | Referenz: Hannover, Germany, 2012

Automated Debugging from Pre-Silicon to Post-Silicon
Autor: Mehdi Dehbashi, Görschwin Fey
Workshop: 24. GI/GMM/ITG Workshop für Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ)
Referenz: Cottbus, Germany, 2012

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