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Arbeitsgruppe Rechnerarchitektur / AGRA | Informatik | FB03 | Universität Bremen

Dr. Sebastian Huhn, M.Sc.


Der Fokus meiner Tätigkeit liegt auf der Entwicklung von Algorithmen zur Erzeugung hochwertiger Testmengen für digitale Schaltkreise. Ein wichtiger Aspekt ist hierbei die Integration und die gezielte Verwendung von strukturellen Informationen des untersuchten Schaltkreises in formalen Beweistechniken, die im Rahmen der Testgenerierung Anwendung finden.

WiMi

Design für Testbarkeit, Fehlersuche und Zuverlässigkeit
Maßnahmen der nächsten Generation unter Verwendung formaler Techniken

Autor: Sebastian Huhn, Rolf Drechsler
Verlag: Springer
Format: DOI: 10.1007/978-3-031-45319-9, Gebunden (2023)

Advanced Boolean Techniques
Autor: Rolf Drechsler, Sebastian Huhn (Eds.)
Verlag: Springer
Format: DOI 10.1007/978-3-031-28916-3 (2023)

Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques
Autor: Sebastian Huhn, Rolf Drechsler
Verlag: Springer
Format: DOI: 10.1007/978-3-030-69209-4, Gebunden und eBook (2021)

Start Small But Dream Big: On Choosing a Static Variable Order for Multiplier BDDs
Autor: Khushboo Qayyum, Alireza Mahzoon, Rolf Drechsler
Buchtitel: Advanced Boolean Techniques | Herausgeber: Rolf Drechsler, Sebastian Huhn (Eds.)
Verlag: Springer
Format: DOI 10.1007/978-3-031-28916-3 (2023)

SAT-Based Key Determination Attack for Improving the Quality Assessment of Logic Locking Mechanisms
Autor: Marcel Merten, Mohammed E. Djeridane, Sebastian Huhn, Rolf Drechsler
Buchtitel: Advanced Boolean Techniques | Herausgeber: Rolf Drechsler, Sebastian Huhn (Eds.)
Verlag: Springer
Format: DOI 10.1007/978-3-031-28916-3 (2023)

Toward System-Level Assertions for Heterogeneous Systems
Autor: Muhammad Hassan, Thilo Vörtler, Karsten Einwich, Rolf Drechsler, Daniel Große
Buchtitel: Advanced Boolean Techniques | Herausgeber: Rolf Drechsler, Sebastian Huhn (Eds.)
Verlag: Springer
Format: DOI 10.1007/978-3-031-28916-3 (2023)

Programmieren mit Arduinos
Autor: Cornelia Große, Sebastian Huhn, Markus Leuschner
Buchtitel: Schule in Farbigen Zuständen - Lernmodule für den 5. Jahrgang | Herausgeber: Lutz Mädler, Claudia Sobich
Verlag: OpenAccess
Format: (2022)

A Novel Default Risk Prediction and Feature Importance Analysis Technique for Marketplace Lending using Machine Learning
Autor: Sana Hassan Imam, Sebastian Huhn, Lars Hornuf, Rolf Drechsler
Zeitschrift: Journal of Credit and Capital Markets
Details: DOI: 10.3790/ccm.56.1.27, Vol. 56 (2023), Iss. 1 : pp. 27–62 (2023)

Power-aware Test Scheduling Framework for IEEE 1687 Multi-Power Domain Networks using Formal Techniques
Autor: Payam Habiby, Sebastian Huhn, Rolf Drechsler
Zeitschrift: Microelectronics Reliability
Details: DOI: 10.1016/j.microrel.2022.114551, Volume 134, pp. 1-11 (2022)

Determining Application-specific Knowledge for Improving Robustness of Sequential Circuits
Autor: Sebastian Huhn, Stefan Frehse, Robert Wille, Rolf Drechsler
Zeitschrift: IEEE Transactions On Very Large Scale Integration (VLSI) Systems
Details: DOI: 10.1109/TVLSI.2018.2890601, Volume 27, Number 4, Pages. 875-887 (2019)

Arduinos in der Schule - Lernen mit Mikrocontrollern
Autor: Cornelia Große, Claudia Sobich, Sebastian Huhn, Markus Leuschner, Rolf Drechsler, Lutz Mädler
Zeitschrift: Computer + Unterricht
Details: Volume 110, May 2018, Pages 43-45 (2018)

A Multi-Objective Evolutionary Approach for Test Network Design.
Autor: Payam Habiby, Fatemeh Shirinzadeh, Sebastian Huhn, Rolf Drechsler
Konferenz: IEEE European Test Symposium (ETS)
Referenz: The Hague, Netherlands, 2024

RC-IJTAG: A Methodology for Designing Remotely-Controlled IEEE 1687 Scan Networks
Autor: Payam Habiby, Sebastian Huhn, Rolf Drechsler
Konferenz: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Pdf | Referenz: Juan-Les-Pins, France, 2023

Synthesis of IJTAG Networks for Multi-Power Domain Systems on Chips
Autor: Payam Habiby, Natalia Lylina, Chih-Hao Wang, Hans-Joachim Wunderlich, Sebastian Huhn, Rolf Drechsler
Konferenz: IEEE European Test Symposium (ETS)
Pdf | Referenz: Venice, Italy, 2023

Increasing SAT-Resilience of Logic Locking Mechanisms using Formal Methods
Autor: Marcel Merten, Sebastian Huhn, Rolf Drechsler
Konferenz: IEEE European Test Symposium (ETS)
Pdf | Referenz: Venice, Italy, 2023

A Novel LBIST Signature Computation Method for Automotive Microcontrollers using a Digital Twin
Autor: Daniel Tille, Leon Klimasch, Sebastian Huhn
Konferenz: 41st IEEE VLSI Test Symposium (VTS)
Pdf | Referenz: San Diego, USA, 2023

Design Enablement Flow for Circuits with Inherent Obfuscation based on Reconfigurable Transistors
Autor: Jens Trommer, Niladri Bhattacharjee, Thomas Mikolajick, Sebastian Huhn, Marcel Merten, Mohammed E. Djeridane, Muhammad Hassan, Rolf Drechsler, Shubham Rai, Nima Kavand, Armin Darjani, Akash Kumar, Violetta Sessi, Maximilian Drescher, Sabine Kolodinski and Maciej Wiatr
Konferenz: Design, Automation and Test in Europe Conference (DATE)
Pdf | Referenz: Antwerp, Belgium, 2023

Next Generation Design For Testability, Debug and Reliability Using Formal Techniques
Autor: Sebastian Huhn and Rolf Drechsler
Konferenz: International Test Conference (ITC)
Pdf | Referenz: Anaheim, CA, USA, 2022

Quality Assessment of RFET-based Logic Locking Protection Mechanisms using Formal Methods
Autor: Marcel Merten, Sebastian Huhn, Rolf Drechsler
Konferenz: IEEE European Test Symposium (ETS)
Pdf | Referenz: Barcelona, Spain, 2022

A Hardware-based Evolutionary Algorithm with Multi-Objective Optimization Operators for On-Chip Transient Fault Detection
Autor: Marcel Merten, Sebastian Huhn, Rolf Drechsler
Konferenz: 40th IEEE VLSI Test Symposium (VTS)
Pdf | Referenz: San Diego, USA, 2022

A Codeword-based Compactor for On-Chip Generated Debug Data Using Two-Stage Artificial Neural Networks
Autor: Marcel Merten, Sebastian Huhn, Rolf Drechsler
Konferenz: 34th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Pdf | Referenz: Athens, Greece, 2021

Optimization-based Test Scheduling for IEEE 1687 Multi-Power Domain Networks Using Boolean Satisfiability
Autor: Payam Habiby, Sebastian Huhn, Rolf Drechsler
Konferenz: 28th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
Pdf | Referenz: Apulia, Italy, 2021

Power-aware Test Scheduling for IEEE 1687 Networks with Multiple Power Domains
Autor: Payam Habiby, Sebastian Huhn, Rolf Drechsler
Konferenz: 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Pdf | Referenz: Frascati (Rome), Italy, 2020

Combining Machine Learning and Formal Techniques for Small Data Applications - A Framework to Explore New Structural Materials
Autor: Rolf Drechsler, Sebastian Huhn, Christina Plump
Konferenz: Euromicro Conference on Digital System Design (DSD)
Pdf | Referenz: Portorož, Slowenien, 2020

A Hybrid Embedded Multichannel Test Compression Architecture for Low-Pin Count Test Environments in Safety-Critical Systems
Autor: Sebastian Huhn, Daniel Tille, Rolf Drechsler
Konferenz: International Test Conference in Asia (ITC-Asia)
Pdf | Referenz: Tokyo, Japan, 2019

SAT-Hard: A Learning-based Hardware SAT-Solver
Autor: Buse Ustaoglu, Sebastian Huhn, Frank Sill Torres, Daniel Große and Rolf Drechsler
Konferenz: EUROMICRO Digital System Design Conference (DSD)
Pdf | Referenz: Kallithea - Chalkidiki, Greece, 2019

Hybrid Architecture for Embedded Test Compression to Process Rejected Test Patterns
Autor: Sebastian Huhn, Daniel Tille, Rolf Drechsler
Konferenz: IEEE European Test Symposium (ETS)
Pdf | Referenz: Baden Baden, Germany, 2019

SAT-Lancer: A Hardware SAT-Solver for Self-Verification
Autor: Buse Ustaoglu, Sebastian Huhn, Daniel Große, Rolf Drechsler
Konferenz: 28th ACM Great Lakes Symposium on VLSI (GLVLSI)
Pdf | Referenz: pp. 479-482, Chicago, Illinois, USA, 2018
Received Best Poster Award

Building Fast Multi-Agent Systems using Hardware Design Languages for High-Throughput Systems
Autor: Jannis Stoppe, Christina Plump, Sebastian Huhn, Rolf Drechsler
Konferenz: 6th International Conference on Dynamics in Logistics (LDIC)
Pdf | Referenz: Bremen, Germany, 2018

Revealing Properties of Structural Materials by Combining Regression-based Algorithms and Nano Indentation Measurements
Autor: Sebastian Huhn, Heike Sonnenberg, Stephan Eggersglüß, Brigitte Clausen, Rolf Drechsler
Konferenz: 10th IEEE Symposium Series on Computational Intelligence (SSCI)
Pdf | Referenz: Hawaii, USA, 2017

Reconfigurable TAP Controllers with Embedded Compression for Large Test Data Volume
Autor: Sebastian Huhn, Stephan Eggersglüß, Rolf Drechsler
Konferenz: 30th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Pdf | Referenz: Cambridge, UK, 2017

Optimization of Retargeting for IEEE 1149.1 TAP Controllers with Embedded Compression
Autor: Sebastian Huhn, Stephan Eggersglüß, Krishnendu Chakrabarty, Rolf Drechsler
Konferenz: Design, Automation and Test in Europe (DATE)
Pdf | Referenz: Lausanne, Schweiz, 2017

Enhancing Robustness of Sequential Circuits Using Application-specific Knowledge and Formal Methods
Autor: Sebastian Huhn, Stefan Frehse, Robert Wille, Rolf Drechsler
Konferenz: 22nd Asia and South Pacific Design Automation Conference (ASP-DAC)
Pdf | Referenz: Chiba/Tokyo, Japan, 2017

Exploring Superior Structural Materials Using Multi-Objective Optimization and Formal Techniques
Autor: Rolf Drechsler, Stephan Eggersglüß, Nils Ellendt, Sebastian Huhn, Lutz Mädler
Konferenz: 6th IEEE International Symposium on Embedded Computing & System Design (ISED)
Pdf | Referenz: Indian Institute of Technology, Patna, India, 2016

VecTHOR: Low-cost compression architecture for IEEE 1149-compliant TAP controllers
Autor: Sebastian Huhn, Stephan Eggersglüß and Rolf Drechsler
Konferenz: IEEE European Test Symposium (ETS)
Pdf | Referenz: Amsterdam, Niederlande, 2016

Remote Configuration Methodology for IEEE 1687 Scan Networks
Autor: Payam Habiby, Sebastian Huhn and Rolf Drechsler
Workshop: 35. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ)
Pdf | Referenz: Erfurt, Germany, 2023

SAT-based Key Determination Attack for Improving the Quality Assessment of Logic Locking Mechanisms
Autor: Marcel Merten, Mohammed E. Djeridane, Sebastian Huhn, Rolf Drechsler
Workshop: 15th International Workshop on Boolean Problems (IWSBP)
Pdf | Referenz: Bremen, Germany, 2022

Feature Importance and Extensibility for Predicting Loan Defaults in Marketplace Lending using BiLSTM
Autor: Sana Hassan Imam, Sebastian Huhn, Lars Hornuf, Rolf Drechsler
Workshop: Frontiers of Factor Investing Conference (FoFi)
Referenz: Lancaster, UK, 2022

Quality Assessment of RFET-based Logic Locking Protection Mechanisms using Formal Methods
Autor: Marcel Merten, Sebastian Huhn and Rolf Drechsler
Workshop: 34. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ)
Pdf | Referenz: Bremerhaven, Germany, 2022

An ILP-based Global Optimum Test Scheduler for IEEE 1687 Multi-Power Domain Networks
Autor: Payam Habiby, Sebastian Huhn and Rolf Drechsler
Workshop: 34. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ)
Pdf | Referenz: Bremerhaven, Germany, 2022

A Memory-Upscaled Boolean Satisfiability Solver for Complex On-Chip Self-Verification Tasks
Autor: Buse Ustaoglu, Sebastian Huhn and Rolf Drechsler
Workshop: Workshop on Interdependent Challenges of Reliability, Security and Quality (RESCUE)
Pdf | Referenz: Grenoble, France, 2021

Test Scheduling Optimization Model for IEEE 1687 Multi-Power Domain Networks Using Boolean Satisfiability
Autor: Payam Habiby, Sebastian Huhn and Rolf Drechsler
Workshop: 33. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ)
Pdf | Referenz: Nordhausen, Germany, 2021

Enhanced Embedded Test Compression Technique For Processing Incompressible Test Patterns
Autor: Sebastian Huhn, Stephan Eggersglüß and Rolf Drechsler
Workshop: 31. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ)
Pdf | Referenz: Prien am Chiemsee, Germany, 2019

A Document-oriented, Heterogeneous Database Model for Large Experimental Data Sets
Autor: Timo Kohorst and Sebastian Huhn and Rolf Drechsler
Workshop: MAPEX Symposium
Pdf | Referenz: Bremen, Germany, 2018

A Codeword-based Compaction Technique for On-Chip Generated Debug Data Using Two-Stage Artificial Neural Networks
Autor: Sebastian Huhn, Marcel Merten, Stephan Eggersglüß and Rolf Drechsler
Workshop: 30. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ)
Pdf | Referenz: Freiburg (Breisgau), Germany, 2018

Leichtgewichtige Datenkompressions-Architektur für IEEE 1149.1-kompatible Testschnittstellen
Autor: Sebastian Huhn, Stephan Eggersglüß and Rolf Drechsler
Workshop: 28. GI/GMM/ITG Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ)
Pdf | Referenz: Siegen, Germany, 2016

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